Regional and supply-chain research

Semiconductor Testing Probe Card Ate Keyword Candidate Study

Semiconductor Testing Probe Card Ate Keyword Candidate Study. A count note for 13 archive records, dated 2026-10-16: labels, existing excerpts and record links, without stable rankings.

Revision and archive snapshot: 2026-10-16

Swipe tables sideways to see all columns.

Research findings

Cohort structure analysis

Recorded reporting jurisdiction counts in this 13-record cohort: Shenzhen (7 records); Beijing (2 records).

The record-count gap between Shenzhen and Beijing is 5, or 38.5% of this 13-record base. The gap concerns records, not revenue or market position.

Company cohortDirectly linked pagesShare of public archiveArchive date
13130.1%2026-10-16

Deduplicated company IDs.

Counts within parent sets

SetAll recordsThis subsetExcluding this subset
All public archive records19,2971319,284

Observed labels

DimensionLabelCount/baseParticipation
reporting jurisdictionShenzhen7/1353.8%
reporting jurisdictionBeijing2/1315.4%
reporting jurisdictionNingbo1/137.7%
reporting jurisdictionAnhui1/137.7%
reporting jurisdictionZhejiang1/137.7%
industryAdvanced equipment9/1369.2%
industryNext-generation information technology4/1330.8%

Multi-label counts can overlap; filter compliance is not industrial advantage.

Evidence and list-linkage counts

MeasureCount
Companies with existing sourced excerpts4/13
Existing reviewed bilingual excerpt pairs4
IDs linked to 2026 local lists6/13

Existing excerpts do not certify entire old reports; list linkage is not final recognition. Full definitions are on the series page.

How candidates match

FieldMatches/candidates
Name0/13
Product field13/13
Sub-industry0/13

Fields can overlap; hits establish search relevance only.

Recorded roles and delivery checks

Delivery framework, stages and original sources

Related studies and shared records

Comparison studyReference recordsShared IDsFocal onlyIntersection/union
Semiconductor Metrology Test Equipment Keyword Candidate Study5211220.4%
Wafer Probe Card Test Socket Keyword Candidate Study631018.8%

Company samples and record links

CompanyJurisdictionRecorded industry
Physike Technology Co., Ltd.BeijingAdvanced equipment
Ningbo Chuanyuan PRECISION Machinery Co., Ltd.NingboAdvanced equipment
Shenzhen Image Technology Co., Ltd.ShenzhenAdvanced equipment
Semishare Co., Ltd.ShenzhenNext-generation information technology
Qianhai Jingfangyun (Shenzhen) Testing Equipment Co., Ltd.ShenzhenNext-generation information technology
Shenzhen East Space Light Technology Co., Ltd.ShenzhenAdvanced equipment
Anhui ZeYou Technology Co., Ltd.AnhuiAdvanced equipment
Zhejiang Jinlian Technology Co., Ltd.ZhejiangNext-generation information technology

Directly related profiles and reports

Methodology

Read ID deduplication, comparison, batch and evidence definitions